Abstract
About this talk
Thin film multilayers composed of alternating layers of magnetic and nonmagnetic layers have attracted the scientific community due to their interesting magnetic properties and industrial applications. We have investigated metal-silicon multilayers in which the Fe layers are the ferromagnetic layers. Silicon layers were used as the spacer layers. Several multilayers of the form [Fe(tFe)/Si(tSi)]20 were prepared by dc magnetron sputtering. X-ray diffraction studies show that the Fe layers are polycrystalline whereas the Si layers are amorphous. X-ray reflectivity measurements showed the formation of periodic multilayers. High resolution transmission electron diffraction patterns also confirmed the formation of nanocrystalline Fe layers. M-H and M-T magnetization studies on the samples indicated the formation ferromagnetic layers of Fe. Anomalous Hall effect studies showed large enhancement of anomalous Hall coefficient. The results indicated the role of Fe/Si interfaces on the enhancement of the anomalous Hall effect. Scaling law studies showed that the side jump is the dominant scattering mechanism. Further investigations also showed high Hall sensitivity when compared with other Fe based multilayers.
Audience take away:
- The presentation will describe the experimental results obtained on the multilayers and analysis of the data.
- The audience working in the area of magnetic multilayers will be able to use the knowledge in this area for their research.
- Faculty and students in the relevant areas will be able to expand their research activities.
Speaker
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