Prospective study of copper sulfide nanofilms

Title : Prospective study of copper sulfide nanofilms

Abstract:

This keynote talk will be devoted to describe hexagonal Cu2S p-type semiconductor thin film fabrication using DC magnetron sputtering. Nanofilms with thickness gradient were successfully deposited by taking advantage of the deposition geometry and target dimensions. X-ray diffraction (XRD) analysis confirmed the exclusive formation of the hexagonal Cu2S phase. Elemental composition and thickness dependence with sample position were determined using energy-dispersive x-ray spectroscopy (EDS). Optical properties, including the optical bandgap and refractive index were assessed by modeling transmittance spectra. XRD data analysis successfully determined the film thickness as a function of sample position, aligning well with thickness values derived from transmittance spectra analyses. These results were further supported by film thickness values obtained from cross-sectional scanning electron microscopy (SEM) images. Charge carrier density and mobility, extracted from the optical models, were found to be consistent with DC electrical measurements.

Biography:

Professor De Morais (H59), PhD, full Professor of Physics at the University of Brasilia (UnB) – Brazil up to 2013. Appointed as UnB’s (Brazil) Emeritus Professor (2014); Visiting Professor at the Huazhong University of Science and Technology (HUST) – China (2012-2015); Distinguished Professor at the Anhui University (AHU) – China (2016-2019); Full Professor at the Catholic University of Brasília – Brazil since 2018; 2007 Master Research Prize from UnB. He held two-years (1987-1988) position with Bell Communications Research, New Jersey – USA. Doctoral degree in Solid State Physics (1986) from the Federal University of Minas Gerais – Brazil. With more than 13,500 citations, He has published more than 500 papers (Web of Science), presented more than 200 international invited talks, and filed 16 patents.