An electron microscope called a scanning electron microscope SEM scans a sample's surface with a concentrated stream of electrons to create pictures of the material. As the electrons contact with the sample's atoms, different signals emerge that provide details about the sample's surface topography and composition. A raster scan pattern is used to scan the electron beam, and a picture is created by combining the detected signal's strength with the beam's position. Using a secondary electron detector, the most popular SEM mode detects secondary electrons released by atoms stimulated by the electron beam Everhart–Thornley detector. The specimen topography affects, among other things, the quantity of secondary electrons that may be detected and, consequently, the signal intensity. Some SEMs can provide resolutions that are superior to 1 nm. Specimens are examined at a variety of cryogenic or high temperatures using specialist equipment, as well as in high vacuum in a normal SEM, low vacuum or wet circumstances in a variable pressure or environmental SEM, and both dry and wet conditions in a typical SEM.
With the growing issue of excess used textiles and their environmental impact, it is essential to explore solutions that extend the life cycle of clothing. Understanding how the morphology of…
Sessions are CPD-accredited; certificates issued to every registered delegate within two weeks of the conference.
Oral and poster slots for original Scanning Electron Microscopy work, reviewed by the scientific committee.
Meet materials researchers, engineers, and academics from around the world across three days.
Accepted abstracts appear in the indexed conference proceedings with a citable DOI.
Plenary lectures from leading voices shaping Scanning Electron Microscopy research and practice.
Attend in person in Singapore or join virtually — same programme, same certificate.
Oral and poster slots for your work — in person in Singapore or online. Not presenting? Attend as a delegate to learn from the field.
The Scanning Electron Microscopy track is a dedicated stream within Materials 2027 covering the latest research, methods, and applications in Scanning Electron Microscopy. It brings together researchers, engineers, and academics for oral presentations, posters, and discussion.
Materials researchers, engineers, educators, doctoral students, and R&D leaders with an interest in Scanning Electron Microscopy are all welcome — whether presenting or attending.
Yes. Submit an abstract for oral or poster presentation. All submissions are peer-reviewed by the scientific committee; accepted abstracts appear in the indexed proceedings.
Yes. Materials 2027 is a hybrid conference — attend the Scanning Electron Microscopy track in person in Singapore or join live online, with on-demand access afterward.
Singapore · March 18–20, 2027· Hybrid · in-person & virtual
Attend without presenting.
