With reported resolution on the scale of fractions of a nanometer, more than 1000 times greater than the optical diffraction limit, atomic force microscopy AFM or scanning force microscopy SFM is a very-high-resolution kind of scanning probe microscopy SPM. With a resolution that has been proved to be on the order of fractions of a nanometer, atomic force microscopy AFM is a form of scanning probe microscopy SPM, and it is more than 1000 times more sensitive than the optical diffraction limit. Using a mechanical probe, data is obtained by "feeling" or "touching" the surface. Precision scanning is made possible by piezoelectric components that permit small, exact motions under electrical control. The Atomic Force Microscope does not, despite its name, employ nuclear force. The force measurement, topography imaging, and manipulation are the three main capabilities of the AFM. AFMs can be used to measure the forces acting on the solution and the robe in force measurement. This is accomplished by raster scanning the sample's location in relation to the tip and measuring the height of the probe, which corresponds to a continual contact between the probe and the sample see Topographic picture for additional information. A pseudocolor plot is a typical way to show the surface topography. Although Binnig, Quate, and Gerber's initial article on atomic force microscopy in 1986 speculated about the possibility of achieving atomic resolution, significant experimental obstacles had to be overcome before Ohnesorge and Binnig were able to demonstrate atomic resolution of defects and step edges in ambient liquid conditions in 1993.
Almost all metallic alloys deform through nucleation and propagation of slip bands. Slip localization implies that macroscopic deformation is inappropriate in investigating mechanisms of local…
Sessions are CPD-accredited; certificates issued to every registered delegate within two weeks of the conference.
Oral and poster slots for original Atomic Force Microscopy work, reviewed by the scientific committee.
Meet materials researchers, engineers, and academics from around the world across three days.
Accepted abstracts appear in the indexed conference proceedings with a citable DOI.
Plenary lectures from leading voices shaping Atomic Force Microscopy research and practice.
Attend in person in Singapore or join virtually — same programme, same certificate.
Oral and poster slots for your work — in person in Singapore or online. Not presenting? Attend as a delegate to learn from the field.
The Atomic Force Microscopy track is a dedicated stream within Materials 2027 covering the latest research, methods, and applications in Atomic Force Microscopy. It brings together researchers, engineers, and academics for oral presentations, posters, and discussion.
Materials researchers, engineers, educators, doctoral students, and R&D leaders with an interest in Atomic Force Microscopy are all welcome — whether presenting or attending.
Yes. Submit an abstract for oral or poster presentation. All submissions are peer-reviewed by the scientific committee; accepted abstracts appear in the indexed proceedings.
Yes. Materials 2027 is a hybrid conference — attend the Atomic Force Microscopy track in person in Singapore or join live online, with on-demand access afterward.
Singapore · March 18–20, 2027· Hybrid · in-person & virtual
Attend without presenting.
