Scanning Probe Microscopy

The name "SPM" refers to a collection of surface-sensitive methods, each of which relies on the examination of a particular physical characteristic at the nanometer scale by a pointed proximal probe. For instance, the original SPM, the STM, and the AFM all measure the local conductivity and surface hardness, respectively. An important piece of nanoscience technology called scanning probe microscopy SPM has now been applied to a wide range of fundamental and practical domains. Its application to basic science caused a paradigm change in how people think about and perceive matter at the atomic and even subatomic scales. SPM physically rasterscans samples and collects information from the surface locally using a pointy tip. With atomic or nanoscale resolution, SPM can directly detect a variety of signals in real space, providing insights into the mechanical, electrical, optical, magnetic, biochemical, electronic, and vibrational characteristics. The main ideas and characteristics of SPM and SPM setup and variants are introduced in this primer, with an emphasis on scanning tunnelling microscopy and atomic force microscopy. We provide instructions on how to carry out SPM experiments and analyse data from SPM imaging, spectroscopy, and manipulation. The most recent uses of SPM in biology, atomic force, microscopyatomic force microscopy, physics, and chemistry are then emphasised.