The name "SPM" refers to a collection of surface-sensitive methods, each of which relies on the examination of a particular physical characteristic at the nanometer scale by a pointed proximal probe. For instance, the original SPM, the STM, and the AFM all measure the local conductivity and surface hardness, respectively. An important piece of nanoscience technology called scanning probe microscopy SPM has now been applied to a wide range of fundamental and practical domains. Its application to basic science caused a paradigm change in how people think about and perceive matter at the atomic and even subatomic scales. SPM physically rasterscans samples and collects information from the surface locally using a pointy tip. With atomic or nanoscale resolution, SPM can directly detect a variety of signals in real space, providing insights into the mechanical, electrical, optical, magnetic, biochemical, electronic, and vibrational characteristics. The main ideas and characteristics of SPM and SPM setup and variants are introduced in this primer, with an emphasis on scanning tunnelling microscopy and atomic force microscopy. We provide instructions on how to carry out SPM experiments and analyse data from SPM imaging, spectroscopy, and manipulation. The most recent uses of SPM in biology, atomic force, microscopyatomic force microscopy, physics, and chemistry are then emphasised.
Almost all metallic alloys deform through nucleation and propagation of slip bands. Slip localization implies that macroscopic deformation is inappropriate in investigating mechanisms of local…
Sessions are CPD-accredited; certificates issued to every registered delegate within two weeks of the conference.
Oral and poster slots for original Scanning Probe Microscopy work, reviewed by the scientific committee.
Meet materials researchers, engineers, and academics from around the world across three days.
Accepted abstracts appear in the indexed conference proceedings with a citable DOI.
Plenary lectures from leading voices shaping Scanning Probe Microscopy research and practice.
Attend in person in Singapore or join virtually — same programme, same certificate.
Oral and poster slots for your work — in person in Singapore or online. Not presenting? Attend as a delegate to learn from the field.
The Scanning Probe Microscopy track is a dedicated stream within Materials 2027 covering the latest research, methods, and applications in Scanning Probe Microscopy. It brings together researchers, engineers, and academics for oral presentations, posters, and discussion.
Materials researchers, engineers, educators, doctoral students, and R&D leaders with an interest in Scanning Probe Microscopy are all welcome — whether presenting or attending.
Yes. Submit an abstract for oral or poster presentation. All submissions are peer-reviewed by the scientific committee; accepted abstracts appear in the indexed proceedings.
Yes. Materials 2027 is a hybrid conference — attend the Scanning Probe Microscopy track in person in Singapore or join live online, with on-demand access afterward.
Singapore · March 18–20, 2027· Hybrid · in-person & virtual
Attend without presenting.
