A beam of electrons is transmitted through a material to create a picture in the microscopy method known as transmission electron microscopy TEM. Most frequently, the specimen is a suspension on a grid or an ultrathin slice that is less than 100 nm thick. As the beam passes through the specimen, a picture is created as a result of the electrons' interactions with it. An imaging device, such as a fluorescent screen, a sheet of photographic film, or a sensor like a scintillator linked to a charge-coupled device, is then used to magnify and focus the picture. Because electrons have a shorter de Bie wavelength than light, transmission electron microscopes can image at a substantially better resolution than light microscopes. Since a single column of atoms is thousands of times smaller than a resolvable object observed in a light microscope, this allows the equipment to record extremely fine detail. In the physical, chemical, and biological sciences, transmission electron microscopy is a crucial analytical technique. TEMs are useful in the study of cancer, viruses, and materials, as well as in the study of pollution, nanotechnology, and semiconductors, as well as in other disciplines including palaeontology and palynology.
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Sessions are CPD-accredited; certificates issued to every registered delegate within two weeks of the conference.
Oral and poster slots for original Transmission Electron Microscopy work, reviewed by the scientific committee.
Meet materials researchers, engineers, and academics from around the world across three days.
Accepted abstracts appear in the indexed conference proceedings with a citable DOI.
Plenary lectures from leading voices shaping Transmission Electron Microscopy research and practice.
Attend in person in Singapore or join virtually — same programme, same certificate.
Oral and poster slots for your work — in person in Singapore or online. Not presenting? Attend as a delegate to learn from the field.
The Transmission Electron Microscopy track is a dedicated stream within Materials 2027 covering the latest research, methods, and applications in Transmission Electron Microscopy. It brings together researchers, engineers, and academics for oral presentations, posters, and discussion.
Materials researchers, engineers, educators, doctoral students, and R&D leaders with an interest in Transmission Electron Microscopy are all welcome — whether presenting or attending.
Yes. Submit an abstract for oral or poster presentation. All submissions are peer-reviewed by the scientific committee; accepted abstracts appear in the indexed proceedings.
Yes. Materials 2027 is a hybrid conference — attend the Transmission Electron Microscopy track in person in Singapore or join live online, with on-demand access afterward.
Singapore · March 18–20, 2027· Hybrid · in-person & virtual
Attend without presenting.
