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9th Edition of

International Conference on Materials Science and Engineering

March 23-25, 2026 | Singapore

Transmission Electron Microscopy

Transmission Electron Microscopy

A beam of electrons is transmitted through a material to create a picture in the microscopy method known as transmission electron microscopy TEM. Most frequently, the specimen is a suspension on a grid or an ultrathin slice that is less than 100 nm thick. As the beam passes through the specimen, a picture is created as a result of the electrons' interactions with it. An imaging device, such as a fluorescent screen, a sheet of photographic film, or a sensor like a scintillator linked to a charge-coupled device, is then used to magnify and focus the picture. Because electrons have a shorter de Bie wavelength than light, transmission electron microscopes can image at a substantially better resolution than light microscopes. Since a single column of atoms is thousands of times smaller than a resolvable object observed in a light microscope, this allows the equipment to record extremely fine detail. In the physical, chemical, and biological sciences, transmission electron microscopy is a crucial analytical technique. TEMs are useful in the study of cancer, viruses, and materials, as well as in the study of pollution, nanotechnology, and semiconductors, as well as in other disciplines including palaeontology and palynology.

Committee Members
Speaker at International Conference on Materials Science and Engineering 2026 - Harry Ruda

Harry Ruda

University of Toronto, Canada
Speaker at International Conference on Materials Science and Engineering 2026 - Stanislaw Dzwigaj

Stanislaw Dzwigaj

Sorbonne University, France
Speaker at International Conference on Materials Science and Engineering 2026 - Piotr Gebara

Piotr Gebara

Czestochowa University of Technology, Poland
Materials 2026 Speakers
Speaker at International Conference on Materials Science and Engineering 2026 - M G H Zaidi

M G H Zaidi

G B Pant University of Agriculture & Technology, India
Speaker at International Conference on Materials Science and Engineering 2026 - Alain Portavoce

Alain Portavoce

IM2NP/CNRS, France
Speaker at International Conference on Materials Science and Engineering 2026 - Silvie Maria Tanu Halim

Silvie Maria Tanu Halim

McMaster University, Canada
Speaker at International Conference on Materials Science and Engineering 2026 - An Yi Chang

An Yi Chang

University of California San Diego, United States
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